JPS544830B2 - - Google Patents

Info

Publication number
JPS544830B2
JPS544830B2 JP1536375A JP1536375A JPS544830B2 JP S544830 B2 JPS544830 B2 JP S544830B2 JP 1536375 A JP1536375 A JP 1536375A JP 1536375 A JP1536375 A JP 1536375A JP S544830 B2 JPS544830 B2 JP S544830B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1536375A
Other languages
Japanese (ja)
Other versions
JPS5190572A (en]
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1536375A priority Critical patent/JPS544830B2/ja
Publication of JPS5190572A publication Critical patent/JPS5190572A/ja
Publication of JPS544830B2 publication Critical patent/JPS544830B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1536375A 1975-02-07 1975-02-07 Expired JPS544830B2 (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1536375A JPS544830B2 (en]) 1975-02-07 1975-02-07

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1536375A JPS544830B2 (en]) 1975-02-07 1975-02-07

Publications (2)

Publication Number Publication Date
JPS5190572A JPS5190572A (en]) 1976-08-09
JPS544830B2 true JPS544830B2 (en]) 1979-03-10

Family

ID=11886703

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1536375A Expired JPS544830B2 (en]) 1975-02-07 1975-02-07

Country Status (1)

Country Link
JP (1) JPS544830B2 (en])

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5254381A (en) * 1975-10-29 1977-05-02 Mitsubishi Electric Corp Method of testing moisture resistance of semiconductor device
JPS5390767A (en) * 1977-01-20 1978-08-09 Matsushita Electric Ind Co Ltd Hermetic sealing testing method of semiconductor parts
JPS6039981U (ja) * 1983-08-27 1985-03-20 楠本化成株式会社 環境試験器
WO2009157037A1 (ja) * 2008-06-24 2009-12-30 アキム株式会社 電子部品検査装置、電子部品検査システム

Also Published As

Publication number Publication date
JPS5190572A (en]) 1976-08-09

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